Using close - field probes to reduce design risks early in a project

Using close - field probes to reduce design risks early in a project image #1

This article, and the ones that will follow it, are about dealing with EMC issues during design and other  project stages, to save time and money; reduce project/financial risks, and to help ensure that if we take  products to a ‘proper’ EMC test lab for compliance testing, they will pass on the first test.  

Close‐field EMC probing (often called near‐field probing) is difficult to do accurately, but it is an excellent  qualitative technique that can be used to compare the EM characteristics of one thing, with those of  another.

 For this reason, although – like computer simulation – close‐field probing cannot (generally, yet) be used to  prove that a particular EMC laboratory test would be passed, it is of huge benefit in helping us discover and  fix EMC problems.  

First published in the EMC Journal, Issue 112, June 2014

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